For more than twenty yrs, Infineon is with the forefront of developing solutions addressing needs for energy discounts, size reduction, system integration and enhanced reliability in its products. Identification of stacking faults in silicon carbide by polarization-solved second harmonic generation microscopy. Silicon carbide (SiC) is usually a wide-bandgap semiconductor material https://www.facebook.com/permalink.php?story_fbid=pfbid0vuY47mVAJy6xu3SK1ZxACHZWQJconX3a8FZ1nP6MPCJj8jnt6HRFfFSx3j9vpWNpl&id=61560512640678&__cft__[0]=AZVDbNnu3CjtxHSY7qE5yeUdbf2iZFPQ77yTbG4L6ETD8leJZVrh4RP1V1J7fx2IzIMkkDHq4lypRIeeGEt6DIWzKIQONSLdaKlt3woU4TMQVDcew55M0oeg7MvgCCeX73fEpms5TgjZsCMepgKV2x93V0lUBAE_ptCP_rGSeiTEByRadw4LGB1MNht3SjN5G_rBIGZX76xgWrE5JzWy1CzT&__tn__=%2CO%2CP-R